Creating A Next Generation Test Case Including Vcat/Lcas And Gfp - EXFO FTB-8510B Guia Del Usuario

Creating a Next Generation Test Case including
VCAT/LCAS and GFP
The following procedure describes a Next Generation test case, including
VCAT/LCAS and GFP .
To create a Next Generation Test Case on an FTB-8120NG,
FTB-8120NGE, FTB-8130NG, or FTB-8130NGE module:
1. Test configuration:
1a. Select the source Clock Mode that will be used
1b. Select Normal as the Test Mode. Refer to Test
1c. Leave the Coupled check box selected.
1d. Select the Through check box to loop the RX
1e. Select the SONET/SDH Intrusive check box to loop the RX signal
1f. Leave the OTN Intrusive check box cleared.
1g. Press Next.
2. Interface connector selection:
2a. From the data path
2b. For OC-192/STM-64 leave the Framing selection
SONET/SDH Application
for the test. Refer to Clock Configuration on
page 129 for more information.
Configuration on page 126 for more information.
signal to the TX port. The Clock Mode is automatically set to
Recovered when the Through check box is selected.
to the TX port with TX overwrite capabilities. Available when the
Coupled check box is selected.
selector, press the
Optical interface connector. Optical is automatically selected
when SONET/SDH Intrusive check box is selected.
to Framed.
Creating and Starting a Test Case
Typical Test Cases
103