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E • Medidas de Resistencia
Todas las escalas de resistencia del multímetro utilizan una excitación de baja
potencia, permitiendo una medida precisa de la resistencia dentro de circuito.
Conecte la punta de prueba roja a la entrada V W, y la negra a la entrada COM.
Ponga el selector de función/escala en la posición W deseada.
Aplique las
puntas de prueba al circuito que desee medir
Aparece el valor de la resisten-
cia en el visualizador LCD.
F • Mesure de Résistance
Tous les calibres de résistance utilisent une basse tension et permettent la mesure
en circuit.
Connectez le cordon rouge à l'entrée VW et le noir à lentrée COM.
Placez le sélecteur sur la position W s
ouhaitée.
Connectez les cordons au cir-
cuit à mesurer.
Lisez la valeur affichée.
DIODE AND TRANSISTOR TEST (See Fig 4)
The diode test function allows accurate measurements of forward voltage drops
across diodes and transistor junctions. A constant-current source forces 1mA of
current into the semiconductor junction under test, which results in the voltage
drop being displayed on the Digital Display. This function also permits measure-
ment of in-circuit semiconductor junctions with as little as 500W in parallel with
the transistor or diode. The limited current produced by the instrument in the
Diode Test Function minimizes the possibility of damage to lowpower semicon-
ductor junctions.
Connect the red test lead to the V W Input and the black test lead to the COM
Input.
Set Function/Range Switch to the Diode Test (G) position.
Connect test leads to device.
Read forward voltage drop on Digital Display.
If the Digital Display reads "1" (overload), reverse the lead connections. The
placement of the leads when the forward voltage is displayed (normally 600mV to
900mV) indicates the orientation of the diode. The red lead is then connected to
the anode and the black lead to the cathode. If "1" is displayed with both lead con-
nections, the junction is open. If a low reading (less than 1V) is obtained with
both lead connections, the junction is shorted internally or (if the junction is mea-
sured in a circuit) is shunted by a resistance less than 500 ohms. In the latter case
the junction must be disconnected from the circuit in order to verify its operation.
Transistors can be tested in the same manner as diodes by checking the two diode
junctions formed between the base and emitter and the base and collector of the
transistor.
N N o o t t e e : : When diode test voltage drop is <0.4V, an W symbol appears in the display,
and beeper sounds (see continuity test).
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