Technical Data - BEHA Unitest TELARIS Fi/RCD Manual De Instrucciones

13.0 Technical Data

13.1 Tables wih test currents
Table 1 Test Currents Function VC/RE, tRCD/VC, Auto (mA)
I∆N UB/RE- x0.5
Measurement:
Prestest
10 4
5
30 12
15
100 40
50
300 120
150 105 150
500 200
250 175 250
400
1000
500
Table 2 Ramp Currents Function I<, tRCD/VC (mA)
I∆N
10 4-14 1-20
30 12-42 3-60
100 40-140 10-200
300 120-420 30 - 600
500 200-700 50-1000
1000 400-1400
Table 3 RCD Trip Times for standard RCB´s
Fi/RCD-Type Current Type Current Type
I∆N
I∆N
x0.5
x1
10mA/ x2
30mA/ x5
100mA/ Ramp
300mA/ x0.5
500mA/ x1
1000mA x2
x5
Ramp
x0.5
x1
x2
x5
Ramp
x1
3,5 5 10 14 20
10,5 15 30 42 60
35 50 100 141 200
300 424 600
500 707 1000
1000
1-20
30-60
10-200
30-600
50-1000
Test Current prescribed
I∆N Trip Time
0.5x -
1x <300ms
2x <150ms
5x <40ms
0.4x- 1.4x <300ms
0.35x -
1.4x <300ms
2.8x <150ms
7x <40ms
0.1x- 2x <300ms
0.5x -
2x <300ms
4x <150ms
10x <40ms
0.1x- 2x <300ms
Technical Data
x2 x5
~
20 28 40 50 70 100
60 84 120 150 212 300
200 283 400 500 707 600
600 849 1200 1500
1000
2000
Test Time Standard
DIN VDE
IEC61008-1
2000ms, I∆N≥100mA: 500ms
500ms IEC61008-1
150ms IEC61008-1
40ms IEC61008-1
300ms IEC61008-1
IEC61008-1
2000ms, I∆N≥100mA: 500ms
500ms IEC61008-1
150ms IEC61008-1
40ms IEC61008-1
300ms IEC61008-1
2000ms, I∆N≥100mA: 500ms 0664- Part 100
500ms
0664- Part 100
150ms
0664- Part 100
40ms
0664- Part 100
300ms
0664- Part 100
Fi/RCD
Analyzer
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