Disassembly And Disposal; Maintenance - SICK W4F Instrucciones De Uso

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Disassembly and disposal

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Maintenance

8025304 / 2021-05-12 | SICK
Subject to change without notice
LED indicator/fault pattern
No object in beam path, no
output signal
Yellow LED flashes
Yellow LED lights up, although
an object is in the path of the
beam.
The sensor must be disposed of according to the applicable country-specific regula‐
tions. Efforts should be made during the disposal process to recycle the constituent
materials (particularly precious metals).
NOTE
Disposal of batteries, electric and electronic devices
•
According to international directives, batteries, accumulators and electrical or
electronic devices must not be disposed of in general waste.
• The owner is obliged by law to return this devices at the end of their life to the
respective public collection points.
•
WEEE: This symbol on the product, its package or in this document,
indicates that a product is subject to these regulations.
SICK sensors are maintenance-free.
We recommend doing the following regularly:
• Clean the external lens surfaces
• Check the screw connections and plug-in connections
No modifications may be made to devices.
Subject to change without notice. Specified product properties and technical data are
not written guarantees.
DISASSEMBLY AND DISPOSAL
Cause
Test input (Test) is not con‐
nected properly
Distance between sender
(WS) and receiver (WE) is
too large / Beam of WS is
not completely on WE or WE
is not aligned to WS / Front
screen and/or reflector is con‐
taminated.
The beam of light of a pho‐
toelectric through-beam sen‐
sor hits the receiver of
another (neighboring) photo‐
electric through-beam sensor
Measures
Check connection of the test
input. When using female cable
connectors with LED indicators,
make sure the test input is
assigned correspondingly.
Check sensing range / Clean‐
ing of the optical surfaces.
Swap the sender and receiver
arrangement at every sec‐
ond through-beam photoelec‐
tric sensor and ensure that
there is sufficient distance
between the through-beam
photoelectric sensors
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